Vacancy No. 03-2019-IMT

03-2019-IMT PhD Position: Characterization of surfaces at the micro and nanoscale, using correlated data from vertical scanning interferometry, atomic force microscopy, and ToF-SIMS

Job description

The aim of this PhD work is the establishment of a correlative analysis method for the characterization of structured surfaces, which are composed of layers of different materials. The measurement methods aims to obtain a clear correlation between topography, mechanical properties and chemical behavior at sub-micrometer level. This information is the basis for sustainably optimizing the surface layers to meet the requirements of applications. The information is generated from data resulting from the combination of Vertical Scanning Interferometry, Atomic Force Microscopy and ToF-SIMS. This requires both a spatial correlation in the measurement and a corresponding data correlation.

Personal qualification
  • University degree (Diploma (UNI) / Master) in physics, mechanical engineering, micro technology or electrical engineering
  • Basic knowledge of physics and mechanics
  • Experience in micro fabrication and topological characterization methods
  • Analytical skills to solve physical and technical issues
  • Interest in Computer Science and Materials Science
  • Good English knowledge
Organizational unit

Institute of Microstructure Technology (IMT)

Starting date

as soon as possible

Contract duration

limited to 3 years

Application up to


Contact person in line-management

For further information, please contact Prof. Dr. Korvink, e-mail:, phone 0721 608-22740


Please apply online using the button below for this vacancy number 03-2019-IMT.
Personnel support is provided by 

Ms Gätcke
phone: +49 721 608-25010,

Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany

If qualified, severely disabled persons will be preferred.