Vacancy No. 03-2019-IMT
03-2019-IMT PhD Position: Characterization of surfaces at the micro and nanoscale, using correlated data from vertical scanning interferometry, atomic force microscopy, and ToF-SIMS
The aim of this PhD work is the establishment of a correlative analysis method for the characterization of structured surfaces, which are composed of layers of different materials. The measurement methods aims to obtain a clear correlation between topography, mechanical properties and chemical behavior at sub-micrometer level. This information is the basis for sustainably optimizing the surface layers to meet the requirements of applications. The information is generated from data resulting from the combination of Vertical Scanning Interferometry, Atomic Force Microscopy and ToF-SIMS. This requires both a spatial correlation in the measurement and a corresponding data correlation.
- University degree (Diploma (UNI) / Master) in physics, mechanical engineering, micro technology or electrical engineering
- Basic knowledge of physics and mechanics
- Experience in micro fabrication and topological characterization methods
- Analytical skills to solve physical and technical issues
- Interest in Computer Science and Materials Science
- Good English knowledge
Institute of Microstructure Technology (IMT)
as soon as possible
limited to 3 years
Application up to
Contact person in line-management
For further information, please contact Prof. Dr. Korvink, e-mail: email@example.com, phone 0721 608-22740
Please apply online using the button below for this vacancy number 03-2019-IMT.
Personnel support is provided by
phone: +49 721 608-25010,
Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany
If qualified, severely disabled persons will be preferred.